Marcos GuillénL Q José ParedesÓscar Camacho2026-03-222026-03-222004https://andeanlibrary.org/handle/123456789/54461Citaciones: 3This paper presents an approach to analyze different kinds of chemical process instrumentation faults. The proposed approach makes a detection and diagnosis of the instrument worsening in the process. To differentiate valve and transmitter problems an analysis in the wavelet domain is presented along with pattern recognition procedures, such as correlation coefficient and Euclidean distance approaches.esWaveletArtificial intelligenceComputer sciencePattern recognition (psychology)Domain (mathematical analysis)Process (computing)MathematicsComputer visionarticle