José AguilarMariela CerradaKatiuska Morillo2026-03-222026-03-22200010.1016/s1474-6670(17)37360-3https://doi.org/10.1016/s1474-6670(17)37360-3https://andeanlibrary.org/handle/123456789/54054Citaciones: 6enReliability (semiconductor)Reliability engineeringFuzzy logicEngineeringComputer scienceRisk analysis (engineering)ProductivitySystems engineeringA Reliability-Based Failure Management Application Using Intelligent Hybrid Systemsarticle