Evaluation and Characterization of Thin Films on AISI 9840 by Electrochemical Noise

C.P. Castillo MorquechoC. López-MeléndezHilda Esperanza Esparza PonceA. Duarte-MöllerVíctor M. Orozco-CarmonaCitlalli Gaona-TiburcioFacundo Almeraya-CalderónA. Martínez-Villafañe2026-03-222026-03-22201510.1016/s1452-3981(23)05057-5https://doi.org/10.1016/s1452-3981(23)05057-5https://andeanlibrary.org/handle/123456789/67888enElectrochemical noiseMaterials scienceCharacterization (materials science)ElectrochemistryNoise (video)NanotechnologyOptoelectronicsEvaluation and Characterization of Thin Films on AISI 9840 by Electrochemical Noisearticle