Evaluation of Test Data in Determining Minimum Design Requirements for Aluminum-to-Copper Connectors [includes discussion]

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dc.contributor.authorDolan Hubbard
dc.contributor.authorR. W. Kunkle
dc.contributor.authorA. B. Chance
dc.coverage.spatialBolivia
dc.date.accessioned2026-03-22T16:37:30Z
dc.date.available2026-03-22T16:37:30Z
dc.date.issued1954
dc.descriptionCitaciones: 7
dc.identifier.doi10.1109/aieepas.1954.4498864
dc.identifier.urihttps://doi.org/10.1109/aieepas.1954.4498864
dc.identifier.urihttps://andeanlibrary.org/handle/123456789/59340
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers
dc.relation.ispartofTransactions of the American Institute of Electrical Engineers Part III Power Apparatus and Systems
dc.sourceCentralia College
dc.subjectCopper
dc.subjectAluminium
dc.subjectReliability engineering
dc.subjectTest (biology)
dc.subjectTest data
dc.subjectElectrical conductor
dc.subjectComputer science
dc.subjectEngineering
dc.subjectElectrical engineering
dc.subjectEngineering drawing
dc.titleEvaluation of Test Data in Determining Minimum Design Requirements for Aluminum-to-Copper Connectors [includes discussion]
dc.typearticle

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