2D XAFS-XEOL Spectroscopy – Some recent developments

Abstract

The use of optical photons to measure the modulation of the absorption coefficient upon X-ray excitation, or optical XAFS, is of particular interest for application to the study of light emitting semiconducting nanomaterials due to the additional information that may be gained. The potential for site-selectivity, elemental and excitation energy specific luminescence decay channels, and surface vs. bulk effects all make the use of X-ray excited optical luminescence (XEOL) desirable as a detection method. Previous experiments have made use of a monochromator to select the optical emission wavelength used to monitor optical XAFS. This method of detection suffers from the primary limitation of only being able to monitor the optical response at one emission wavelength. By combining the high resolution soft X-ray Spherical Grating Monochromator beam-line at the Canadian Light Source with an Ocean Optics QE 65000 fast CCD spectrophotometer and custom integration software we have developed a technique for collecting 2D XAFS-XEOL spectra, in which the excitation energy is scanned and a XEOL spectra is collected for every energy value. Herein we report the development of this technique and its capabilities using the study of the luminescence emitted from single crystal zinc oxide as an example.